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http://hdl.handle.net/2261/25
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| タイトル: | HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits. |
| 著者: | Shiga, Hidehiro
Okabe, Yoichi |
| 著者(別言語): | 岡部, 洋一 |
| キーワード: | interface
quasi-particle
SFQ
CMOS |
| Issue Date: | May-2002 |
| 出版者: | Institute of Electronics, Information and Communication Engineers |
| 掲載誌情報: | IEICE Transactions on Electronics, E85-C (3). pp. 650-653 |
| 抄録: | We have fabricated a prototype of interface devices between SFQ and CMOS circuits using HTS quasi-particle injection devices. By the injection of quasi-particles, the bridge area becomes resistive and high voltage appears at the drain electrode. As a test of device operation, we applied the signal of a function generator to the gate electrode and observed that the device successfully repeated on/off operation. We also succeeded in explaining the device characteristics by considering the thermal effects. |
| URI: | http://hdl.handle.net/2261/25 |
| ISSN: | 09168524 |
| Appears in Collections: | 16610 学術雑誌論文
015 技術・工学
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