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Please use this identifier to cite or link to this item: http://hdl.handle.net/2261/26

タイトル: Interface-Modified Ramp-Type Josephson Junctions in Trilayer Structures.
著者: Matsushita, Masayuki
Okabe, Yoichi
著者(別言語): 岡部, 洋一
キーワード: interface-modified
ramp-type
trilayer structures
Josephson junction
Issue Date: Mar-2002
出版者: Institute of Electronics, Information and Communication Engineers
掲載誌情報: IEICE Transactions on Electronics, E85-C (3). pp. 769-771
抄録: We have fabricated ramp-type Josephson junctions in trilayer structures. A bilayer of YBa_2Cu_3O_<7-x> (YBCO)/CeO_2 was deposited on a SrTiO_3 (100) substrate. Then, circle patterns with a diameter of 2 μm were etched on the bilayer surface using standard photolithography process. During the Ar ion milling with an incident angle of 45 degrees to the bilayer surface, the sample was rotated. This process led to upside-down conical formations. After the ramp-edge surface was modified, another YBCO film was deposited for the top electrode. The junctions showed the I-V characteristics between resistively shunted junction and flux-flow types.
URI: http://hdl.handle.net/2261/26
ISSN: 09168524
Appears in Collections:16610 学術雑誌論文
015 技術・工学

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