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Surface Phenomena of Semiconductor Materials : An Investigation using Raman Microscopy
https://doi.org/10.11501/3127060
https://doi.org/10.11501/31270606bf08e66-a43b-4f37-aade-b44b2c2bce28
名前 / ファイル | ライセンス | アクション |
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312250.pdf (20.7 MB)
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
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公開日 | 2013-04-25 | |||||
タイトル | ||||||
タイトル | Surface Phenomena of Semiconductor Materials : An Investigation using Raman Microscopy | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_46ec | |||||
タイプ | thesis | |||||
ID登録 | ||||||
ID登録 | 10.11501/3127060 | |||||
ID登録タイプ | JaLC | |||||
その他のタイトル | ||||||
その他のタイトル | 顕微ラマン分光法を用いた半導体材料の界面現象に関する研究 | |||||
著者 |
Ajito, Katsuhiro
× Ajito, Katsuhiro |
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著者別名 | ||||||
識別子 | 10222 | |||||
識別子Scheme | WEKO | |||||
姓名 | 味戸, 克裕 | |||||
著者所属 | ||||||
著者所属 | 東京大学大学院工学系研究科応用化学専攻 | |||||
書誌情報 | 発行日 1995-09-29 | |||||
学位名 | ||||||
学位名 | 博士(工学) | |||||
学位 | ||||||
値 | doctoral | |||||
学位分野 | ||||||
Engineering(工学) | ||||||
学位授与機関 | ||||||
学位授与機関名 | University of Tokyo (東京大学) | |||||
研究科・専攻 | ||||||
Department of Applied chemistry, Graduate School of Engineering(工学系研究科応用化学専攻) | ||||||
学位授与年月日 | ||||||
学位授与年月日 | 1995-09-29 | |||||
学位授与番号 | ||||||
学位授与番号 | 甲第11520号 | |||||
学位記番号 | ||||||
博工第3524号 |