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特集2 : 研究解説 : Transient of Electrostatic Potential at GaAs/AlAs Heterointerfaces Characterized by X-Ray Photoemission Spectroscopy
http://hdl.handle.net/2261/49918
http://hdl.handle.net/2261/49918b4be7a86-a975-4556-9019-83ab69eadade
名前 / ファイル | ライセンス | アクション |
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sk046003003.pdf (541.7 kB)
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2012-11-16 | |||||
タイトル | ||||||
タイトル | 特集2 : 研究解説 : Transient of Electrostatic Potential at GaAs/AlAs Heterointerfaces Characterized by X-Ray Photoemission Spectroscopy | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | departmental bulletin paper | |||||
その他のタイトル | ||||||
その他のタイトル | XPS法によるGaAs/AlAsヘテロ界面における遷移領域の評価 | |||||
著者 |
HIRAKAWA, Kazuhiko
× HIRAKAWA, Kazuhiko× HASHIMOTO, Yoshio× IKOMA, Toshiaki |
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著者別名 | ||||||
識別子 | 32954 | |||||
識別子Scheme | WEKO | |||||
姓名 | 平川, 一彦 | |||||
著者別名 | ||||||
識別子 | 32955 | |||||
識別子Scheme | WEKO | |||||
姓名 | 橋本, 佳男 | |||||
著者別名 | ||||||
識別子 | 32956 | |||||
識別子Scheme | WEKO | |||||
姓名 | 生駒, 俊明 | |||||
著者所属 | ||||||
著者所属 | Center for Function Oriented Electronics, Institute of Industrial Science, University of Tokyo 電子工学 | |||||
著者所属 | ||||||
著者所属 | Deaprtment of Electrical and Electronic Engineering, Shinsyu University 電子工学 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We systematically studied the Ga3d and Al2p cation core level binding energies in molecular beam epitaxially grown GaAs/AlAs heterostructures by in-situ x-ray photoemission spectroscopy. The valence band offset ΔEv at GaAs/AlAs interface is found to be 0.44±0.55 eV. Furthermore, we found that the cation core level binding energies in the extreme vicinity of the interface are shifted by ~0.1 eV from their respective bulk values, which clearly indicates that the charge distribution and the resulting band offsets have a transient over a distance of at least ±2 monolayers from the heterointerface. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 小特集 機能エレクトロニクス研究センター | |||||
書誌情報 |
生産研究 巻 46, 号 3, p. 160-164, 発行日 1994-03 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0037105X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00127075 | |||||
日本十進分類法 | ||||||
主題 | 428 | |||||
主題Scheme | NDC | |||||
出版者 | ||||||
出版者 | 東京大学生産技術研究所 | |||||
出版者別名 | ||||||
Institute of Industrial Science, the University of Tokyo |