{"created":"2021-03-01T06:16:33.127158+00:00","id":17,"links":{},"metadata":{"_buckets":{"deposit":"3e8ef945-afc9-4fdf-b9e9-20faaf437d90"},"_deposit":{"id":"17","owners":[],"pid":{"revision_id":0,"type":"depid","value":"17"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00000017","sets":["12:13","9:10:14"]},"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"653","bibliographicPageStart":"650","bibliographicVolumeNumber":"E85-C","bibliographic_titles":[{"bibliographic_title":"IEICE transactions on electronics"}]}]},"item_2_description_13":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have fabricated a prototype of interface devices between SFQ and CMOS circuits using HTS quasi-particle injection devices. By the injection of quasi-particles, the bridge area becomes resistive and high voltage appears at the drain electrode. As a test of device operation, we applied the signal of a function generator to the gate electrode and observed that the device successfully repeated on/off operation. We also succeeded in explaining the device characteristics by considering the thermal effects.","subitem_description_type":"Abstract"}]},"item_2_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"75","nameIdentifierScheme":"WEKO"}],"names":[{"name":"岡部, 洋一"}]}]},"item_2_publisher_20":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electronics, Information and Communication Engineers"}]},"item_2_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA10826283","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09168524","subitem_source_identifier_type":"ISSN"}]},"item_2_subject_15":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"549.2","subitem_subject_scheme":"NDC"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shiga, Hidehiro"}],"nameIdentifiers":[{"nameIdentifier":"73","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okabe, Yoichi"}],"nameIdentifiers":[{"nameIdentifier":"74","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-05-30"}],"displaytype":"detail","filename":"IEICE2002_E85C_3_650.pdf","filesize":[{"value":"266.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"IEICE2002_E85C_3_650.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/17/files/IEICE2002_E85C_3_650.pdf"},"version_id":"5b591340-4bab-49eb-9c96-3d8d5457bc13"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"interface","subitem_subject_scheme":"Other"},{"subitem_subject":"quasi-particle","subitem_subject_scheme":"Other"},{"subitem_subject":"SFQ","subitem_subject_scheme":"Other"},{"subitem_subject":"CMOS","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits"}]},"item_type_id":"2","owner":"1","path":["13","14"],"pubdate":{"attribute_name":"公開日","attribute_value":"2006-02-06"},"publish_date":"2006-02-06","publish_status":"0","recid":"17","relation_version_is_last":true,"title":["HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits"],"weko_creator_id":"1","weko_shared_id":2},"updated":"2022-12-19T03:40:55.231149+00:00"}