{"created":"2021-03-01T06:37:30.054061+00:00","id":19994,"links":{},"metadata":{"_buckets":{"deposit":"bbe2f3f8-f2f9-4487-9e63-d8c8fadfdf77"},"_deposit":{"id":"19994","owners":[],"pid":{"revision_id":0,"type":"depid","value":"19994"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00019994","sets":["171:1108:1500:1504","9:504:1111:1502:1505"]},"item_4_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"How the Scanning Acoustic Microscope can be used for the non-destructive inspections"}]},"item_4_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1985-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"468","bibliographicPageStart":"461","bibliographicVolumeNumber":"37","bibliographic_titles":[{"bibliographic_title":"生産研究"}]}]},"item_4_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"音響レンズにより平面超音波を集束し、その方位分解能を高めた超音波顕微鏡によれば、光や電子線を用いた従来の顕微鏡に比べ、はるかに物体の内部に関する情報を抽出することが可能である。本稿ではこの超音波顕微鏡を画像観察だけでなく、工業計測に用いることの可能性を示すと共に、現時点において定量計測に成功したと思われる2、3の例を紹介している","subitem_description_type":"Abstract"}]},"item_4_description_6":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"特集 生産・加エシステムの最適化","subitem_description_type":"Other"}]},"item_4_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"38691","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SEMBA, Takuya"}]}]},"item_4_publisher_20":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学生産技術研究所"}]},"item_4_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00127075","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0037105X","subitem_source_identifier_type":"ISSN"}]},"item_4_subject_15":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"530","subitem_subject_scheme":"NDC"}]},"item_4_text_21":{"attribute_name":"出版者別名","attribute_value_mlt":[{"subitem_text_value":"Institute of Industrial Science, the University of Tokyo"}]},"item_4_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学生産技術研究所第2部 生産計画学"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"仙波, 卓弥"}],"nameIdentifiers":[{"nameIdentifier":"38690","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-08"}],"displaytype":"detail","filename":"sk037011009.pdf","filesize":[{"value":"821.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"sk037011009.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/19994/files/sk037011009.pdf"},"version_id":"e8fce3df-ae13-451c-b8c6-287b39aeec59"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"特集7 : 研究解説 : 超音波顕微鏡の計測装置としての可能性","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"特集7 : 研究解説 : 超音波顕微鏡の計測装置としての可能性"}]},"item_type_id":"4","owner":"1","path":["1504","1505"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-12-20"},"publish_date":"2010-12-20","publish_status":"0","recid":"19994","relation_version_is_last":true,"title":["特集7 : 研究解説 : 超音波顕微鏡の計測装置としての可能性"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-19T03:58:46.867276+00:00"}