{"created":"2021-03-01T06:39:51.808345+00:00","id":22174,"links":{},"metadata":{"_buckets":{"deposit":"e5a8fdd8-5cbf-4b81-8914-f97489a46b9a"},"_deposit":{"id":"22174","owners":[],"pid":{"revision_id":0,"type":"depid","value":"22174"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00022174","sets":["171:1108:1892:1916","9:504:1111:1894:1917"]},"item_4_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Automatic Diagnosis of Digital System"}]},"item_4_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1969-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"15","bibliographicPageStart":"9","bibliographicVolumeNumber":"21","bibliographic_titles":[{"bibliographic_title":"生産研究"}]}]},"item_4_description_13":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_4_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"現在各所で実現されつつある実時間電子計算機システムにおいては,信頼度が大であるという能力の他に故障が生じても短時間で復旧し得る能力(保守度)が必要である.ここでは,電子計算機システムなどのディジタル・システムの処理装置(PU)の自動故障診断に関して述べる.特に診断用のテスト・パターンを作成するアルゴリズム,実際にテスト・パターンを作成した例および自動故障診断における問題点に関して報告する.","subitem_description_type":"Abstract"}]},"item_4_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"113078","nameIdentifierScheme":"WEKO"}],"names":[{"name":"WATANABE, Masaru"}]},{"nameIdentifiers":[{"nameIdentifier":"113079","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SUGIMOTO, Masakatsu"}]}]},"item_4_publisher_20":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学生産技術研究所"}]},"item_4_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00127075","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0037105X","subitem_source_identifier_type":"ISSN"}]},"item_4_subject_15":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"500","subitem_subject_scheme":"NDC"}]},"item_4_text_21":{"attribute_name":"出版者別名","attribute_value_mlt":[{"subitem_text_value":"Institute of Industrial Science. University of Tokyo"}]},"item_4_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学生産技術研究所 第3部 電子演算工学"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渡辺, 勝"}],"nameIdentifiers":[{"nameIdentifier":"113076","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"杉本, 正勝"}],"nameIdentifiers":[{"nameIdentifier":"113077","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-26"}],"displaytype":"detail","filename":"sk021001003.pdf","filesize":[{"value":"743.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"sk021001003.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/22174/files/sk021001003.pdf"},"version_id":"f2137526-7b56-40a2-a119-00759839003e"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"ディジタル・システムの自動故障診断","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ディジタル・システムの自動故障診断"}]},"item_type_id":"4","owner":"1","path":["1916","1917"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-12-25"},"publish_date":"2009-12-25","publish_status":"0","recid":"22174","relation_version_is_last":true,"title":["ディジタル・システムの自動故障診断"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-19T04:00:03.086737+00:00"}