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  1. 134 生産技術研究所
  2. 生産研究
  3. 18
  4. 12
  1. 0 資料タイプ別
  2. 30 紀要・部局刊行物
  3. 生産研究
  4. 18
  5. 12

MOS形FETの静特性に対するバルクバイアスの影響

http://hdl.handle.net/2261/31680
0f494665-4a03-407b-8b00-924582a6ee1b
名前 / ファイル ライセンス アクション
sk018012006.pdf sk018012006.pdf (190.9 kB)
Item type 紀要論文 / Departmental Bulletin Paper(1)
公開日 2009-12-25
タイトル
タイトル MOS形FETの静特性に対するバルクバイアスの影響
言語
言語 jpn
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ departmental bulletin paper
その他のタイトル
その他のタイトル Effect of Bulk Bias Voltage on the Static Characteristics of MOSFET
著者 安達, 芳夫

× 安達, 芳夫

WEKO 114051

安達, 芳夫

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上村, 幸守

× 上村, 幸守

WEKO 114052

上村, 幸守

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著者別名
識別子
識別子 114053
識別子Scheme WEKO
姓名
姓名 ADACHI, Yoshio
著者別名
識別子
識別子 114054
識別子Scheme WEKO
姓名
姓名 UEMURA, Yukimori
著者所属
著者所属 東京大学生産技術研究所 情報処理工学
著者所属
著者所属 Institute of Industrial Science. University of Tokyo
書誌情報 生産研究

巻 18, 号 12, p. 339-340, 発行日 1966-12-01
ISSN
収録物識別子タイプ ISSN
収録物識別子 0037105X
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AN00127075
フォーマット
内容記述タイプ Other
内容記述 application/pdf
日本十進分類法
主題 500
主題Scheme NDC
出版者
出版者 東京大学生産技術研究所
出版者別名
Institute of Industrial Science. University of Tokyo
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