{"created":"2021-03-01T06:40:40.655229+00:00","id":22928,"links":{},"metadata":{"_buckets":{"deposit":"9bb4b46b-6181-4079-919d-c5b01a331745"},"_deposit":{"id":"22928","owners":[],"pid":{"revision_id":0,"type":"depid","value":"22928"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00022928","sets":["171:1108:2048:2064","9:504:1111:2050:2065"]},"item_4_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"A Method of Obtaining One-Dimensional Higher Order Aberration Function by Means of Ray Tracing"}]},"item_4_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1963-05-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"136","bibliographicPageStart":"135","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"生産研究"}]}]},"item_4_description_13":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_4_publisher_20":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学生産技術研究所"}]},"item_4_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00127075","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0037105X","subitem_source_identifier_type":"ISSN"}]},"item_4_subject_15":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"500","subitem_subject_scheme":"NDC"}]},"item_4_text_21":{"attribute_name":"出版者別名","attribute_value_mlt":[{"subitem_text_value":"Institute of Industrial Science. University of Tokyo"}]},"item_4_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学生産技術研究所 応用光学"},{"subitem_text_value":"Institute of Industrial Science. University of Tokyo"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"朝倉, 利光"}],"nameIdentifiers":[{"nameIdentifier":"114971","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-26"}],"displaytype":"detail","filename":"sk015005005.pdf","filesize":[{"value":"256.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"sk015005005.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/22928/files/sk015005005.pdf"},"version_id":"860c5b47-2789-471d-beb1-f79ab0132573"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"光線追跡から一次元高次収差関数を求める方法","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"光線追跡から一次元高次収差関数を求める方法"}]},"item_type_id":"4","owner":"1","path":["2064","2065"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-12-24"},"publish_date":"2009-12-24","publish_status":"0","recid":"22928","relation_version_is_last":true,"title":["光線追跡から一次元高次収差関数を求める方法"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-19T04:00:59.922807+00:00"}