{"created":"2021-03-01T06:16:33.896364+00:00","id":30,"links":{},"metadata":{"_buckets":{"deposit":"d9948286-eaea-46b6-a8d9-933980de61af"},"_deposit":{"id":"30","owners":[],"pid":{"revision_id":0,"type":"depid","value":"30"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00000030"},"item_2_biblio_info_7":{"attribute_name":"\u66f8\u8a8c\u60c5\u5831","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"2627","bibliographicPageStart":"2624","bibliographicVolumeNumber":"5","bibliographic_titles":[{"bibliographic_title":"IEEE transactions on applied superconductivity : a publication of the IEEE Superconductivity Committee"}]}]},"item_2_description_13":{"attribute_name":"\u30d5\u30a9\u30fc\u30de\u30c3\u30c8","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_2_description_5":{"attribute_name":"\u6284\u9332","attribute_value_mlt":[{"subitem_description":"Thin film of YBa(2)Cu3O(7-delta) grown on the MgO substrate damaged by a focused ion beam loses superconductivity due to an abnormal growth. We have fabricated a YBa2Cu3O7-delta co-planar Josephson junction whose coupling region is a nonsuperconductive YBa2Cu3O7-delta grown on an MgO substrate damaged locally by a scan of a focused ion beam. The I-V characteristic of the junction behaves like a flux how type. At temperatures from 4.2K to 60K, Shapiro steps were observed for the junctions in which the length of the coupling region was from 0.2 mu m to 1 mu m. The highest IcRn product of the junction was 5.0mV. The critical current density decreased exponentially with the junction length. It is considered that nonsuperconductive YBa2CU3O7-delta grown on the damaged substrate works as a normal layer in an S-N-S junction. Also the junction responded to the magnetic field and behaved like asymmetric de-SQUID.","subitem_description_type":"Abstract"}]},"item_2_full_name_3":{"attribute_name":"\u8457\u8005\u5225\u540d","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"127","nameIdentifierScheme":"WEKO"}],"names":[{"name":"\u5ca1\u90e8, \u6d0b\u4e00"}]}]},"item_2_publisher_20":{"attribute_name":"\u51fa\u7248\u8005","attribute_value_mlt":[{"subitem_publisher":"IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC"}]},"item_2_source_id_10":{"attribute_name":"\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID","attribute_value_mlt":[{"subitem_source_identifier":"AA10791666","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10518223","subitem_source_identifier_type":"ISSN"}]},"item_2_subject_15":{"attribute_name":"\u65e5\u672c\u5341\u9032\u5206\u985e\u6cd5","attribute_value_mlt":[{"subitem_subject":"549.2","subitem_subject_scheme":"NDC"}]},"item_creator":{"attribute_name":"\u8457\u8005","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Soutome, Yoshihisa"}],"nameIdentifiers":[{"nameIdentifier":"124","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Gheem, YG"}],"nameIdentifiers":[{"nameIdentifier":"125","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okabe, Yoichi"}],"nameIdentifiers":[{"nameIdentifier":"126","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"\u30d5\u30a1\u30a4\u30eb\u60c5\u5831","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-05-30"}],"displaytype":"detail","filename":"IEEE_A_S_1995_5_2_3_2624.pdf","filesize":[{"value":"367.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"IEEE_A_S_1995_5_2_3_2624.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/30/files/IEEE_A_S_1995_5_2_3_2624.pdf"},"version_id":"178d3c70-1d23-48ff-a134-5df1eb3ab0f9"}]},"item_language":{"attribute_name":"\u8a00\u8a9e","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"\u8cc7\u6e90\u30bf\u30a4\u30d7","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM","item_titles":{"attribute_name":"\u30bf\u30a4\u30c8\u30eb","attribute_value_mlt":[{"subitem_title":"FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM"}]},"item_type_id":"2","owner":"1","path":["12/13","9/10/14"],"pubdate":{"attribute_name":"\u516c\u958b\u65e5","attribute_value":"2006-02-13"},"publish_date":"2006-02-13","publish_status":"0","recid":"30","relation_version_is_last":true,"title":["FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2021-03-02T08:54:33.119744+00:00"}