{"created":"2021-03-01T06:50:52.233027+00:00","id":32223,"links":{},"metadata":{"_buckets":{"deposit":"e2214e7a-5570-46db-bd83-7742c13b450f"},"_deposit":{"id":"32223","owners":[],"pid":{"revision_id":0,"type":"depid","value":"32223"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00032223","sets":["80:4453:4483","9:504:4455:4484"]},"author_link":["71838","71839","71840","71835","71836","71837"],"item_4_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Major and Trace Components Analysis of Silicate Rocks by X-ray Fluorescence Spectrometer Using Fused Glass Beads : Evaluation of Analytical Precision of Three, Six, Eleven Times Dilution Fused Glass Beads Methods"}]},"item_4_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"36","bibliographicPageStart":"26","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"技術研究報告"}]}]},"item_4_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We established a quantitative analysis for 10 major and 15 trace elements in silicate rocks by X-ray fluorescence spectrometry (XRF), using three types of dilution ratio glass bead, i.e., sample : flux ratios of 1 : 2, 1 : 5 and 1 : 10. The individual calibration lines, constructed using 24 igneous rock reference materials issued by USGS and GSJ, showed excellent accuracy and correlation coefficient for both major and trace elements, and no difference among the three types of glass beads, but, overall, the low dilution glass bead method (1 : 2) presented good analytical precision of both major and trace element in comparison with the other high dilution glass beads (1 : 5 and 1 : 10). For the assessment of our data quality, five reference rock materials of SY-2, SY-3, MRG-1, MIN-L and NIM-G, issued by SABS and CANMET were measured using above low dilution glass bead method. Our results were in good agreement with the recommended values reported by Potts et al. (1992), excluding Nb in SY-2, Co, Cr and Rb in SY-3, Ba and Pb in MRG-1, and Co and Ni in NIM-G. This suggests that our XRF method using low dilution glass bead is suitable to rapid and accurate determination of major and trace elements in silicate rocks from single glass bead.","subitem_description_type":"Abstract"}]},"item_4_description_6":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"＜論説＞","subitem_description_type":"Other"}]},"item_4_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"71838","nameIdentifierScheme":"WEKO"}],"names":[{"name":"TANI, Kenichiro"}]},{"nameIdentifiers":[{"nameIdentifier":"71839","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ORIHASHI, Yuji"}]},{"nameIdentifiers":[{"nameIdentifier":"71840","nameIdentifierScheme":"WEKO"}],"names":[{"name":"NAKADA, Setsuya"}]}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.15083/00032214","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_20":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"東京大学地震研究所"}]},"item_4_source_id_10":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11602838","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_8":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13426486","subitem_source_identifier_type":"ISSN"}]},"item_4_text_21":{"attribute_name":"出版者別名","attribute_value_mlt":[{"subitem_text_value":"Earthquake Research Institute，University of Tokyo"}]},"item_4_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"海洋科学技術センター固体地球統合フロンティア研究システム地球内部物質循環研究領域"},{"subitem_text_value":"東京大学地震研究所地球ダイナミクス部門"},{"subitem_text_value":"火山噴火予知推進センター"},{"subitem_text_value":"Program for Geochemical Evolution, Institute for Frontier Research on Earth Evolution, Japan Marine Science & Technology Center"},{"subitem_text_value":"Division of Geodynamics"},{"subitem_text_value":"Volcano Research Center, Earthquake Research Institute, University of Tokyo"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"谷, 健一郎"}],"nameIdentifiers":[{"nameIdentifier":"71835","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"折橋, 裕二"}],"nameIdentifiers":[{"nameIdentifier":"71836","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中田, 節也"}],"nameIdentifiers":[{"nameIdentifier":"71837","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-12"}],"displaytype":"detail","filename":"08_026-036.pdf","filesize":[{"value":"1.3MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"08_026-036.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/32223/files/08_026-036.pdf"},"version_id":"da1a49fa-a3a5-4b58-bceb-cf32151de0c9"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"X-ray fluorescence spectrometry","subitem_subject_scheme":"Other"},{"subitem_subject":"Low dilution glass bead","subitem_subject_scheme":"Other"},{"subitem_subject":"Silicate rock","subitem_subject_scheme":"Other"},{"subitem_subject":"Major and trace element determinations","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"ガラスビードを用いた蛍光X線分析装置による珪酸塩岩石の主・微量成分分析：3倍・6倍・11倍希釈ガラスビード法の分析精度の評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ガラスビードを用いた蛍光X線分析装置による珪酸塩岩石の主・微量成分分析：3倍・6倍・11倍希釈ガラスビード法の分析精度の評価","subitem_title_language":"ja"}]},"item_type_id":"4","owner":"1","path":["4483","4484"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2017-05-15"},"publish_date":"2017-05-15","publish_status":"0","recid":"32223","relation_version_is_last":true,"title":["ガラスビードを用いた蛍光X線分析装置による珪酸塩岩石の主・微量成分分析：3倍・6倍・11倍希釈ガラスビード法の分析精度の評価"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2022-12-19T04:07:33.438514+00:00"}