@techreport{oai:repository.dl.itc.u-tokyo.ac.jp:00042136,
 author = {Allen, David E. and McAleer, Michael and Scharth, Marcel},
 month = {Dec},
 note = {application/pdf, 本文フィルはリンク先を参照のこと},
 title = {Realized Volatility Risk},
 year = {2009}
}