{"created":"2021-03-01T06:21:16.264465+00:00","id":4598,"links":{},"metadata":{"_buckets":{"deposit":"6dd631e9-60c0-4665-acd3-1f5e2cec569d"},"_deposit":{"id":"4598","owners":[],"pid":{"revision_id":0,"type":"depid","value":"4598"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00004598","sets":["6:167:344","9:233:280"]},"item_7_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"顕微ラマン分光法を用いた半導体材料の界面現象に関する研究"}]},"item_7_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-09-29","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{}]}]},"item_7_date_granted_25":{"attribute_name":"学位授与年月日","attribute_value_mlt":[{"subitem_dategranted":"1995-09-29"}]},"item_7_degree_grantor_23":{"attribute_name":"学位授与機関","attribute_value_mlt":[{"subitem_degreegrantor":[{"subitem_degreegrantor_name":"University of Tokyo (東京大学)"}]}]},"item_7_degree_name_20":{"attribute_name":"学位名","attribute_value_mlt":[{"subitem_degreename":"博士(工学)"}]},"item_7_dissertation_number_26":{"attribute_name":"学位授与番号","attribute_value_mlt":[{"subitem_dissertationnumber":"甲第11520号"}]},"item_7_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"10222","nameIdentifierScheme":"WEKO"}],"names":[{"name":"味戸, 克裕"}]}]},"item_7_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.11501/3127060","subitem_identifier_reg_type":"JaLC"}]},"item_7_select_21":{"attribute_name":"学位","attribute_value_mlt":[{"subitem_select_item":"doctoral"}]},"item_7_text_22":{"attribute_name":"学位分野","attribute_value_mlt":[{"subitem_text_value":"Engineering(工学)"}]},"item_7_text_24":{"attribute_name":"研究科・専攻","attribute_value_mlt":[{"subitem_text_value":"Department of Applied chemistry, Graduate School of Engineering(工学系研究科応用化学専攻)"}]},"item_7_text_27":{"attribute_name":"学位記番号","attribute_value_mlt":[{"subitem_text_value":"博工第3524号"}]},"item_7_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学大学院工学系研究科応用化学専攻"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ajito, Katsuhiro"}],"nameIdentifiers":[{"nameIdentifier":"10221","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-01"}],"displaytype":"detail","filename":"312250.pdf","filesize":[{"value":"20.7 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"312250.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/4598/files/312250.pdf"},"version_id":"4bee769d-aec9-49ca-bd54-636897458969"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"thesis","resourceuri":"http://purl.org/coar/resource_type/c_46ec"}]},"item_title":"Surface Phenomena of Semiconductor Materials : An Investigation using Raman Microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Surface Phenomena of Semiconductor Materials : An Investigation using Raman Microscopy"}]},"item_type_id":"7","owner":"1","path":["280","344"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-04-25"},"publish_date":"2013-04-25","publish_status":"0","recid":"4598","relation_version_is_last":true,"title":["Surface Phenomena of Semiconductor Materials : An Investigation using Raman Microscopy"],"weko_creator_id":"1","weko_shared_id":2},"updated":"2022-12-19T03:46:16.452068+00:00"}