{"created":"2021-03-01T06:25:02.418892+00:00","id":8234,"links":{},"metadata":{"_buckets":{"deposit":"ac0efc15-b764-4e85-87db-03a25707dc4e"},"_deposit":{"id":"8234","owners":[],"pid":{"revision_id":0,"type":"depid","value":"8234"},"status":"published"},"_oai":{"id":"oai:repository.dl.itc.u-tokyo.ac.jp:00008234","sets":["6:209:392","9:233:280"]},"item_7_alternative_title_1":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"ひずみSiおよびひずみのないSi MOS界面の電気的評価と界面欠陥が素子特性に与える影響"}]},"item_7_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-03-24","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{}]}]},"item_7_date_granted_25":{"attribute_name":"学位授与年月日","attribute_value_mlt":[{"subitem_dategranted":"2015-03-24"}]},"item_7_degree_grantor_23":{"attribute_name":"学位授与機関","attribute_value_mlt":[{"subitem_degreegrantor":[{"subitem_degreegrantor_name":"University of Tokyo(東京大学)"}]}]},"item_7_degree_name_20":{"attribute_name":"学位名","attribute_value_mlt":[{"subitem_degreename":"博士(工学)"}]},"item_7_description_6":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"学位の種別: 課程博士","subitem_description_type":"Other"},{"subitem_description":"審査委員会委員 : (主査)東京大学教授 高木 信一, 東京大学教授 平川 一彦, 東京大学教授 平本 俊郎, 東京大学准教授 竹中 充, 東京大学准教授 小林 正治, 東京大学教授 鳥海 明","subitem_description_type":"Other"}]},"item_7_dissertation_number_26":{"attribute_name":"学位授与番号","attribute_value_mlt":[{"subitem_dissertationnumber":"12601甲第31484号"}]},"item_7_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"141469","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Cai, Wei-Li"}]}]},"item_7_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.15083/00008225","subitem_identifier_reg_type":"JaLC"}]},"item_7_select_12":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"none"}]},"item_7_select_21":{"attribute_name":"学位","attribute_value_mlt":[{"subitem_select_item":"doctoral"}]},"item_7_text_24":{"attribute_name":"研究科・専攻","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical Engineering and Information Systems, Graduate School of Engineering (工学系研究科電気系工学専攻)"}]},"item_7_text_27":{"attribute_name":"学位記番号","attribute_value_mlt":[{"subitem_text_value":"博工第8536号"}]},"item_7_text_4":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"工学系研究科電気系工学専攻"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"蔡, 偉立"}],"nameIdentifiers":[{"nameIdentifier":"141468","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-27"}],"displaytype":"detail","filename":"A31484_summary.pdf","filesize":[{"value":"134.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A31484_summary.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/8234/files/A31484_summary.pdf"},"version_id":"9ac9a9b2-e3e3-4dbe-b4b3-b377173a1ca7"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-27"}],"displaytype":"detail","filename":"A31484_abstract.pdf","filesize":[{"value":"115.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A31484_abstract.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/8234/files/A31484_abstract.pdf"},"version_id":"b5d4e696-18f4-4a1d-822f-69b1eb736726"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-06-27"}],"displaytype":"detail","filename":"A31484_review.pdf","filesize":[{"value":"142.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"A31484_review.pdf","url":"https://repository.dl.itc.u-tokyo.ac.jp/record/8234/files/A31484_review.pdf"},"version_id":"f537b84d-ea10-4df1-9ad4-91fc4ca1a95d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"thesis","resourceuri":"http://purl.org/coar/resource_type/c_46ec"}]},"item_title":"Electrical characterization of strained and unstrained Si MOS interfaces and impact of interface defects on the device properties","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Electrical characterization of strained and unstrained Si MOS interfaces and impact of interface defects on the device properties"}]},"item_type_id":"7","owner":"1","path":["280","392"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-08-09"},"publish_date":"2016-08-09","publish_status":"0","recid":"8234","relation_version_is_last":true,"title":["Electrical characterization of strained and unstrained Si MOS interfaces and impact of interface defects on the device properties"],"weko_creator_id":"1","weko_shared_id":null},"updated":"2022-12-19T03:51:49.080682+00:00"}