{"_buckets": {"deposit": "2821263c-aa10-4301-bd5d-d84ca6a2e335"}, "_deposit": {"id": "16", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "16"}, "status": "published"}, "_oai": {"id": "oai:repository.dl.itc.u-tokyo.ac.jp:00000016"}, "item_2_biblio_info_7": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1999-06", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "2893", "bibliographicPageStart": "2890", "bibliographicVolumeNumber": "9", "bibliographic_titles": [{"bibliographic_title": "IEEE transactions on applied superconductivity : a publication of the IEEE Superconductivity Committee"}]}]}, "item_2_description_13": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_2_description_5": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We have fabricated Josephson junctions in YBa2Cu3 O7-\u03b4 (YBaCuO) thin films by the irradiation of focused ion beam (FIB). We used Be2+ ions with the energy of 200 keV. When the fluence of Be2+ ions was 1.2\u00d71016 ions/cm2, the I-V characteristics of the junctions at 4.2 K showed RSJ-like characteristics with the excess current. The IcRn product of the junctions was 1.1 mV at 6.3 K. Shapiro steps up to 20th step could be observed by the irradiation of 8.47 GHz microwave at 6.3 K. The magnetic modulation curve of the junction at 4.2 K was similar to the Fraunhofer pattern. These characteristics remained unaltered after preservation in a desiccator for 6 months", "subitem_description_type": "Abstract"}]}, "item_2_full_name_3": {"attribute_name": "\u8457\u8005\u5225\u540d", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "72", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "\u5ca1\u90e8, \u6d0b\u4e00"}]}]}, "item_2_publisher_20": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electrical and Electronics Engineers"}]}, "item_2_rights_12": {"attribute_name": "\u6a29\u5229", "attribute_value_mlt": [{"subitem_rights": "\u00a91999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE."}]}, "item_2_source_id_10": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10791666", "subitem_source_identifier_type": "NCID"}]}, "item_2_source_id_8": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "10518223", "subitem_source_identifier_type": "ISSN"}]}, "item_2_subject_15": {"attribute_name": "\u65e5\u672c\u5341\u9032\u5206\u985e\u6cd5", "attribute_value_mlt": [{"subitem_subject": "549.2", "subitem_subject_scheme": "NDC"}]}, "item_2_text_34": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"subitem_text_value": "Journal Article"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Shiga, Hidehiro"}], "nameIdentifiers": [{"nameIdentifier": "69", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Soutome, Yoshihisa"}], "nameIdentifiers": [{"nameIdentifier": "70", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okabe, Yoichi"}], "nameIdentifiers": [{"nameIdentifier": "71", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-05-30"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "IEEE1999_9_2_2890.pdf", "filesize": [{"value": "347.1 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 347100.0, "url": {"label": "IEEE1999_9_2_2890.pdf", "url": "https://repository.dl.itc.u-tokyo.ac.jp/record/16/files/IEEE1999_9_2_2890.pdf"}, "version_id": "9babb870-2b95-4f0c-b183-8bf9518145d9"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "Josephson effect", "subitem_subject_scheme": "Other"}, {"subitem_subject": "barium compounds", "subitem_subject_scheme": "Other"}, {"subitem_subject": "focused ion beam technology", "subitem_subject_scheme": "Other"}, {"subitem_subject": "high-temperature", "subitem_subject_scheme": "Other"}, {"subitem_subject": "superconductors", "subitem_subject_scheme": "Other"}, {"subitem_subject": "superconducting thin films", "subitem_subject_scheme": "Other"}, {"subitem_subject": "yttrium compounds", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Fabrication of YBaCuO junctions by the irradiation of focused ionbeam", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "Fabrication of YBaCuO junctions by the irradiation of focused ionbeam"}]}, "item_type_id": "2", "owner": "1", "path": ["12/13", "9/10/14"], "permalink_uri": "http://hdl.handle.net/2261/24", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2006-02-06"}, "publish_date": "2006-02-06", "publish_status": "0", "recid": "16", "relation": {}, "relation_version_is_last": true, "title": ["Fabrication of YBaCuO junctions by the irradiation of focused ionbeam"], "weko_shared_id": 2}