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研究速報 : Monolithically Integrated Diode Laser Detection System for Scanning Near-Field Optical Microscopy (SNOM) : Study of the Optical Feedback Effect in VCSELs
http://hdl.handle.net/2261/54983
http://hdl.handle.net/2261/54983a1a36420-f879-4551-8512-d51705e9a183
名前 / ファイル | ライセンス | アクション |
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sk051008004.pdf (605.8 kB)
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2013-07-01 | |||||
タイトル | ||||||
タイトル | 研究速報 : Monolithically Integrated Diode Laser Detection System for Scanning Near-Field Optical Microscopy (SNOM) : Study of the Optical Feedback Effect in VCSELs | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | departmental bulletin paper | |||||
著者 |
Khalfallah, Sabry
× Khalfallah, Sabry× Bouchon, Dominique× Fukuda, Satoshi× Gorecki, Christophe× Spager, Michel× Kawakatsu, Hideki× Fujita, Hiroyuki× Arakawa, Yasuhiko |
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著者所属 | ||||||
著者所属 | 3rd Department, Institute of Industrial Science, University of Tokyo | |||||
著者所属 | ||||||
著者所属 | 2nd Department, Institute of Industrial Science, University of Tokyo | |||||
著者所属 | ||||||
著者所属 | Laboratoire d'Optique P.M.Duffieux, University of Besançon (France) | |||||
書誌情報 |
生産研究 巻 51, 号 8, p. 630-633, 発行日 1999-08 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0037105X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00127075 | |||||
出版者 | ||||||
出版者 | 東京大学生産技術研究所 | |||||
出版者別名 | ||||||
Institute of Industrial Science, the University of Tokyo |