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Below-gap励起蛍光法によるSiCの結晶欠陥評価
http://hdl.handle.net/2261/28081
http://hdl.handle.net/2261/28081bfe8546a-65ef-4667-ae9e-82b2846cfe5e
名前 / ファイル | ライセンス | アクション |
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isono.pdf (8.5 MB)
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
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公開日 | 2011-08-08 | |||||
タイトル | ||||||
タイトル | Below-gap励起蛍光法によるSiCの結晶欠陥評価 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_46ec | |||||
タイプ | thesis | |||||
その他のタイトル | ||||||
その他のタイトル | Characterization of Crystallite Defects in SiC by Below-Gap-Excitation Luminescence | |||||
著者 |
磯野, 秀明
× 磯野, 秀明 |
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著者別名 | ||||||
識別子 | 5677 | |||||
識別子Scheme | WEKO | |||||
姓名 | Isono, Hideaki | |||||
著者所属 | ||||||
著者所属 | 東京大学大学院工学系研究科 電子工学専攻 | |||||
書誌情報 | 発行日 2009-03-23 | |||||
日本十進分類法 | ||||||
主題 | 549 | |||||
主題Scheme | NDC | |||||
学位名 | ||||||
学位名 | 修士(工学) | |||||
学位 | ||||||
値 | master | |||||
研究科・専攻 | ||||||
工学系研究科電子工学専攻 | ||||||
学位授与年月日 | ||||||
学位授与年月日 | 2009-03-23 |