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An empirical study of innovators' risk assessment : how innovators gain benefits and are affected from enforcement of patents in litigations?
https://doi.org/10.15083/00077635
https://doi.org/10.15083/00077635cf377ff2-9d6c-4057-9c7a-5de46b9ee70d
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A34333.pdf (2.7 MB)
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A34333_abstract.pdf (177.9 kB)
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A34333_review.pdf (133.0 kB)
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2019-09-19 | |||||
タイトル | ||||||
タイトル | An empirical study of innovators' risk assessment : how innovators gain benefits and are affected from enforcement of patents in litigations? | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_46ec | |||||
タイプ | thesis | |||||
ID登録 | ||||||
ID登録 | 10.15083/00077635 | |||||
ID登録タイプ | JaLC | |||||
その他のタイトル | ||||||
その他のタイトル | イノベーターが原告として特許訴訟に巻き込まれるリスクのアセスメントに関する実証研究 | |||||
著者 |
胡, 韋
× 胡, 韋 |
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著者別名 | ||||||
識別子 | 156799 | |||||
識別子Scheme | WEKO | |||||
姓名 | HU, WEI | |||||
著者所属 | ||||||
著者所属 | 工学系研究科技術経営戦略学専攻 | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 学位の種別: 課程博士 | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 審査委員会委員 : (主査)東京大学教授 渡部 俊也, 東京大学教授 坂田 一郎, 東京大学教授 影山 和郎, 東京大学教授 橋本 正洋, 東京大学教授 劉 海波 | |||||
書誌情報 | 発行日 2017-09-15 | |||||
著者版フラグ | ||||||
値 | ETD | |||||
学位名 | ||||||
学位名 | 博士(工学) | |||||
学位 | ||||||
値 | doctoral | |||||
学位授与機関 | ||||||
学位授与機関名 | University of Tokyo(東京大学) | |||||
研究科・専攻 | ||||||
Department of Technology Management for Innovation, Graduate School of Engineering (工学系研究科技術経営戦略学専攻) | ||||||
学位授与年月日 | ||||||
学位授与年月日 | 2017-09-15 | |||||
学位授与番号 | ||||||
学位授与番号 | 12601甲第34333号 | |||||
学位記番号 | ||||||
博工第9193号 |