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Characterization of BexZn1-xO thin films grow by pulsed laser deposition
http://hdl.handle.net/2261/56161
http://hdl.handle.net/2261/56161f4d444e2-ccba-4c3e-9d33-4793df2c67e3
名前 / ファイル | ライセンス | アクション |
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本文(fulltext) (11.1 MB)
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要旨(summary) (340.6 kB)
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
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公開日 | 2014-11-20 | |||||
タイトル | ||||||
タイトル | Characterization of BexZn1-xO thin films grow by pulsed laser deposition | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_46ec | |||||
タイプ | thesis | |||||
その他のタイトル | ||||||
その他のタイトル | PLD堆積法によるBexZn1-xO 薄膜の作成と評価 | |||||
著者 |
Peltier, Thomas
× Peltier, Thomas |
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著者所属 | ||||||
著者所属 | 東京大学大学院新領域創成科学研究科基盤科学研究系物質系専攻 | |||||
書誌情報 | 発行日 2013-09-27 | |||||
学位名 | ||||||
学位名 | 修士(科学) | |||||
学位 | ||||||
値 | master | |||||
研究科・専攻 | ||||||
新領域創成科学研究科基盤科学研究系物質系専攻 | ||||||
学位授与年月日 | ||||||
学位授与年月日 | 2013-09-27 | |||||
学位記番号 | ||||||
修創域第4910号 |