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FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM
http://hdl.handle.net/2261/42
http://hdl.handle.net/2261/426fb871da-8aa8-42e7-88cd-460d58eb982f
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2006-02-13 | |||||
タイトル | ||||||
タイトル | FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
著者 |
Soutome, Yoshihisa
× Soutome, Yoshihisa× Gheem, YG× Okabe, Yoichi |
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著者別名 | ||||||
識別子Scheme | WEKO | |||||
識別子 | 127 | |||||
姓名 | 岡部, 洋一 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Thin film of YBa(2)Cu3O(7-delta) grown on the MgO substrate damaged by a focused ion beam loses superconductivity due to an abnormal growth. We have fabricated a YBa2Cu3O7-delta co-planar Josephson junction whose coupling region is a nonsuperconductive YBa2Cu3O7-delta grown on an MgO substrate damaged locally by a scan of a focused ion beam. The I-V characteristic of the junction behaves like a flux how type. At temperatures from 4.2K to 60K, Shapiro steps were observed for the junctions in which the length of the coupling region was from 0.2 mu m to 1 mu m. The highest IcRn product of the junction was 5.0mV. The critical current density decreased exponentially with the junction length. It is considered that nonsuperconductive YBa2CU3O7-delta grown on the damaged substrate works as a normal layer in an S-N-S junction. Also the junction responded to the magnetic field and behaved like asymmetric de-SQUID. | |||||
書誌情報 |
IEEE transactions on applied superconductivity : a publication of the IEEE Superconductivity Committee 巻 5, 号 2, p. 2624-2627, 発行日 1995-06 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 10518223 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10791666 | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
日本十進分類法 | ||||||
主題Scheme | NDC | |||||
主題 | 549.2 | |||||
出版者 | ||||||
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |