{"_buckets": {"deposit": "d9948286-eaea-46b6-a8d9-933980de61af"}, "_deposit": {"id": "30", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "30"}, "status": "published"}, "_oai": {"id": "oai:repository.dl.itc.u-tokyo.ac.jp:00000030"}, "item_2_biblio_info_7": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1995-06", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicPageEnd": "2627", "bibliographicPageStart": "2624", "bibliographicVolumeNumber": "5", "bibliographic_titles": [{"bibliographic_title": "IEEE transactions on applied superconductivity : a publication of the IEEE Superconductivity Committee"}]}]}, "item_2_description_13": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_2_description_5": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "Thin film of YBa(2)Cu3O(7-delta) grown on the MgO substrate damaged by a focused ion beam loses superconductivity due to an abnormal growth. We have fabricated a YBa2Cu3O7-delta co-planar Josephson junction whose coupling region is a nonsuperconductive YBa2Cu3O7-delta grown on an MgO substrate damaged locally by a scan of a focused ion beam. The I-V characteristic of the junction behaves like a flux how type. At temperatures from 4.2K to 60K, Shapiro steps were observed for the junctions in which the length of the coupling region was from 0.2 mu m to 1 mu m. The highest IcRn product of the junction was 5.0mV. The critical current density decreased exponentially with the junction length. It is considered that nonsuperconductive YBa2CU3O7-delta grown on the damaged substrate works as a normal layer in an S-N-S junction. Also the junction responded to the magnetic field and behaved like asymmetric de-SQUID.", "subitem_description_type": "Abstract"}]}, "item_2_full_name_3": {"attribute_name": "\u8457\u8005\u5225\u540d", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "127", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "\u5ca1\u90e8, \u6d0b\u4e00"}]}]}, "item_2_publisher_20": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC"}]}, "item_2_source_id_10": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10791666", "subitem_source_identifier_type": "NCID"}]}, "item_2_source_id_8": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "10518223", "subitem_source_identifier_type": "ISSN"}]}, "item_2_subject_15": {"attribute_name": "\u65e5\u672c\u5341\u9032\u5206\u985e\u6cd5", "attribute_value_mlt": [{"subitem_subject": "549.2", "subitem_subject_scheme": "NDC"}]}, "item_2_text_34": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"subitem_text_value": "Journal Article"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Soutome, Yoshihisa"}], "nameIdentifiers": [{"nameIdentifier": "124", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Gheem, YG"}], "nameIdentifiers": [{"nameIdentifier": "125", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okabe, Yoichi"}], "nameIdentifiers": [{"nameIdentifier": "126", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-05-30"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "IEEE_A_S_1995_5_2_3_2624.pdf", "filesize": [{"value": "367.0 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 367000.0, "url": {"label": "IEEE_A_S_1995_5_2_3_2624.pdf", "url": "https://repository.dl.itc.u-tokyo.ac.jp/record/30/files/IEEE_A_S_1995_5_2_3_2624.pdf"}, "version_id": "178d3c70-1d23-48ff-a134-5df1eb3ab0f9"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM"}]}, "item_type_id": "2", "owner": "1", "path": ["12/13", "9/10/14"], "permalink_uri": "http://hdl.handle.net/2261/42", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2006-02-13"}, "publish_date": "2006-02-13", "publish_status": "0", "recid": "30", "relation": {}, "relation_version_is_last": true, "title": ["FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM"], "weko_shared_id": null}