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  1. 166 情報基盤センター
  2. 16610 学術雑誌論文
  1. 0 資料タイプ別
  2. 10 学術雑誌論文
  3. 015 技術・工学

FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM

http://hdl.handle.net/2261/42
6fb871da-8aa8-42e7-88cd-460d58eb982f
名前 / ファイル ライセンス アクション
IEEE_A_S_1995_5_2_3_2624.pdf IEEE_A_S_1995_5_2_3_2624.pdf (367.0 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2006-02-13
タイトル
タイトル FABRICATION OF YBACUO NONSUPERCONDUCTIVE-YBACUO/YBACUO COPLANAR JOSEPHSON-JUNCTION BY FOCUSED ION-BEAM
言語
言語 eng
資源タイプ
資源 http://purl.org/coar/resource_type/c_6501
タイプ journal article
著者 Soutome, Yoshihisa

× Soutome, Yoshihisa

WEKO 124

Soutome, Yoshihisa

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Gheem, YG

× Gheem, YG

WEKO 125

Gheem, YG

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Okabe, Yoichi

× Okabe, Yoichi

WEKO 126

Okabe, Yoichi

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著者別名
識別子
識別子 127
識別子Scheme WEKO
姓名
姓名 岡部, 洋一
抄録
内容記述タイプ Abstract
内容記述 Thin film of YBa(2)Cu3O(7-delta) grown on the MgO substrate damaged by a focused ion beam loses superconductivity due to an abnormal growth. We have fabricated a YBa2Cu3O7-delta co-planar Josephson junction whose coupling region is a nonsuperconductive YBa2Cu3O7-delta grown on an MgO substrate damaged locally by a scan of a focused ion beam. The I-V characteristic of the junction behaves like a flux how type. At temperatures from 4.2K to 60K, Shapiro steps were observed for the junctions in which the length of the coupling region was from 0.2 mu m to 1 mu m. The highest IcRn product of the junction was 5.0mV. The critical current density decreased exponentially with the junction length. It is considered that nonsuperconductive YBa2CU3O7-delta grown on the damaged substrate works as a normal layer in an S-N-S junction. Also the junction responded to the magnetic field and behaved like asymmetric de-SQUID.
書誌情報 IEEE transactions on applied superconductivity : a publication of the IEEE Superconductivity Committee

巻 5, 号 2, p. 2624-2627, 発行日 1995-06
ISSN
収録物識別子タイプ ISSN
収録物識別子 10518223
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA10791666
フォーマット
内容記述タイプ Other
内容記述 application/pdf
日本十進分類法
主題 549.2
主題Scheme NDC
出版者
出版者 IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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