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特集5 : 研究速報 : 走査電子顕微鏡(SEM)を用いた表面粗さ測定の基礎研究
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cc43cd11-4c6a-47e5-b652-3aed71b126a0
名前 / ファイル | ライセンス | アクション | |
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2011-08-22 | |||||
タイトル | ||||||
タイトル | 特集5 : 研究速報 : 走査電子顕微鏡(SEM)を用いた表面粗さ測定の基礎研究 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | departmental bulletin paper | |||||
その他のタイトル | ||||||
その他のタイトル | Surface Roughness Measurement by Scanning Electron Microscope | |||||
著者 |
佐藤, 壽芳
× 佐藤, 壽芳× 大堀, 真敬 |
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著者別名 | ||||||
識別子 | ||||||
識別子 | 41504 | |||||
識別子Scheme | WEKO | |||||
姓名 | ||||||
姓名 | Sato, Hisayoshi | |||||
著者別名 | ||||||
識別子 | ||||||
識別子 | 41505 | |||||
識別子Scheme | WEKO | |||||
姓名 | ||||||
姓名 | O-hori, Masanori | |||||
著者所属 | ||||||
著者所属 | 東京大学生産技術研究所第2部 切削工作計画工学 | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 特集:生産・加工システムの最適化 | |||||
書誌情報 |
生産研究 巻 32, 号 11, p. 530-532, 発行日 1980-11-01 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0037105X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00127075 | |||||
日本十進分類法 | ||||||
主題 | 530 | |||||
主題Scheme | NDC | |||||
出版者 | ||||||
出版者 | 東京大学生産技術研究所 | |||||
出版者別名 | ||||||
Institute of Industrial Science, the University of Tokyo |