{"_buckets": {"deposit": "3e8ef945-afc9-4fdf-b9e9-20faaf437d90"}, "_deposit": {"id": "17", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "17"}, "status": "published"}, "_oai": {"id": "oai:repository.dl.itc.u-tokyo.ac.jp:00000017"}, "item_2_biblio_info_7": {"attribute_name": "\u66f8\u8a8c\u60c5\u5831", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2002-05", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "653", "bibliographicPageStart": "650", "bibliographicVolumeNumber": "E85-C", "bibliographic_titles": [{"bibliographic_title": "IEICE transactions on electronics"}]}]}, "item_2_description_13": {"attribute_name": "\u30d5\u30a9\u30fc\u30de\u30c3\u30c8", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_2_description_5": {"attribute_name": "\u6284\u9332", "attribute_value_mlt": [{"subitem_description": "We have fabricated a prototype of interface devices between SFQ and CMOS circuits using HTS quasi-particle injection devices. By the injection of quasi-particles, the bridge area becomes resistive and high voltage appears at the drain electrode. As a test of device operation, we applied the signal of a function generator to the gate electrode and observed that the device successfully repeated on/off operation. We also succeeded in explaining the device characteristics by considering the thermal effects.", "subitem_description_type": "Abstract"}]}, "item_2_full_name_3": {"attribute_name": "\u8457\u8005\u5225\u540d", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "75", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "\u5ca1\u90e8, \u6d0b\u4e00"}]}]}, "item_2_publisher_20": {"attribute_name": "\u51fa\u7248\u8005", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electronics, Information and Communication Engineers"}]}, "item_2_source_id_10": {"attribute_name": "\u66f8\u8a8c\u30ec\u30b3\u30fc\u30c9ID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10826283", "subitem_source_identifier_type": "NCID"}]}, "item_2_source_id_8": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "09168524", "subitem_source_identifier_type": "ISSN"}]}, "item_2_subject_15": {"attribute_name": "\u65e5\u672c\u5341\u9032\u5206\u985e\u6cd5", "attribute_value_mlt": [{"subitem_subject": "549.2", "subitem_subject_scheme": "NDC"}]}, "item_2_text_34": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"subitem_text_value": "Journal Article"}]}, "item_creator": {"attribute_name": "\u8457\u8005", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Shiga, Hidehiro"}], "nameIdentifiers": [{"nameIdentifier": "73", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Okabe, Yoichi"}], "nameIdentifiers": [{"nameIdentifier": "74", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "\u30d5\u30a1\u30a4\u30eb\u60c5\u5831", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-05-30"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "IEICE2002_E85C_3_650.pdf", "filesize": [{"value": "266.1 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 266100.0, "url": {"label": "IEICE2002_E85C_3_650.pdf", "url": "https://repository.dl.itc.u-tokyo.ac.jp/record/17/files/IEICE2002_E85C_3_650.pdf"}, "version_id": "5b591340-4bab-49eb-9c96-3d8d5457bc13"}]}, "item_keyword": {"attribute_name": "\u30ad\u30fc\u30ef\u30fc\u30c9", "attribute_value_mlt": [{"subitem_subject": "interface", "subitem_subject_scheme": "Other"}, {"subitem_subject": "quasi-particle", "subitem_subject_scheme": "Other"}, {"subitem_subject": "SFQ", "subitem_subject_scheme": "Other"}, {"subitem_subject": "CMOS", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "\u8a00\u8a9e", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "\u8cc7\u6e90\u30bf\u30a4\u30d7", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits", "item_titles": {"attribute_name": "\u30bf\u30a4\u30c8\u30eb", "attribute_value_mlt": [{"subitem_title": "HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits"}]}, "item_type_id": "2", "owner": "1", "path": ["12/13", "9/10/14"], "permalink_uri": "http://hdl.handle.net/2261/25", "pubdate": {"attribute_name": "\u516c\u958b\u65e5", "attribute_value": "2006-02-06"}, "publish_date": "2006-02-06", "publish_status": "0", "recid": "17", "relation": {}, "relation_version_is_last": true, "title": ["HTS Quasi-Particle Injection Devices for Interfaces between SFQ and CMOS Circuits"], "weko_shared_id": 2}